| Chair: |
K. Kinoshita (AIO Core Co., Ltd.) Japan |
| Vice-chair: |
H. Hayashi (Toshiba Memory Corp.) Japan |
| H. Akatsuka (Tokyo Institute of Technology) Japan |
| N. Fujiwara (Mitsubishi Electric Corp.) Japan |
| M. Fukasawa (Sony Semiconductor Solutions Corp.) Japan |
| S. Hamaguchi (Osaka University) Japan |
| S. Higashi (Hiroshima University) Japan |
| M. Honda (TOKYO ELECTRON MIYAGI LTD.) Japan |
| M. Hori (Nagoya University) Japan |
| T. Ichiki (The University of Tokyo) Japan |
| T. Ishijima (Kanazawa University) Japan |
| K. Ishikawa (Nagoya University) Japan |
| K. Karahashi (Osaka University) Japan |
| H. Kokura (Samsung Electronics Co., Ltd) Korea |
| T. Koshizawa (Applied Materials Inc.) USA |
| M. Matsui (Hitachi, Ltd.) Japan |
| N. Negishi (Hitachi, Ltd.) Japan |
| K. Nojiri (Lam Research Corp.) Japan |
| T. Ohiwa (TOKYO ELECTRON LIMITED) Japan |
| T. Okumura (Panasonic Corp.) Japan |
| K. Sasaki (Hokkaido University) Japan |
| M. Sekine (Nagoya University) Japan |
| T. Shirafuji (Osaka City University) Japan |
| T. Tatsumi (Sony Semiconductor Solutions Corp.) Japan |
| M. Terahara (SanDisk Ltd.) Japan |
| Chair: |
M. Hori (Nagoya University) Japan |
| Vice-chair: |
S. Higashi (Hiroshima University) Japan |
| Vice-chair: |
H. Akatsuka (Tokyo Institute of Technology) Japan |
| C. Abe (Toshiba Memory Corp.) Japan |
| J. Hashimoto (Toshiba Memory Corp.) Japan |
| T. Imamura (Toshiba Memory Corp.) Japan |
| H. Kondo (Nagoya University) Japan |
| K. Makihara (Nagoya University) Japan |
| Y. Miyoshi (Sony Semiconductor Solutions Corp.) Japan |
| S. Ochiai (Toshiba Memory Corp.) Japan |
| D. Ogawa (Chubu University) Japan |
| Y. Sato (AGC Asahi Glass) Japan |
| K. Shinoda (Hitachi, Ltd.) Japan |
| H. Suzuki (Nagoya University) Japan |
| K. Takeda (Meijo University) Japan |
| W. Takeuchi (Aichi Institute of Technology) Japan |
| A. Tanide (Nagoya University) Japan |
| M. Terahara (SanDisk Ltd.) Japan |
| T. Tsutsumi (Nagoya University) Japan |
| R.H.J. Vervuurt (ASM Japan) Japan |
| Chair: |
T. Ishijima (Kanazawa University) Japan |
| Vice-chair: |
T. Shirafuji (Osaka City University) Japan |
| Vice-chair: |
K. Karahashi (Osaka University) Japan |
| K. Ishikawa (Nagoya University) Japan |
| T. Ichiki (The University of Tokyo) Japan |
| K. Eriguchi (Kyoto University) Japan |
| S. Higashi (Hiroshima University) Japan |
| K. Kinoshita (AIO Core Co., Ltd.) Japan |
| N. Kuboi (Sony Semiconductor Solutions Corp.) Japan |
| H. Kuwano (Tohoku University) Japan |
| S. Nunomura (Advanced Industrial Science and Technology-AIST) Japan |
| L. Overzet (University of Texas at Dallas) USA |
| K. Sasaki (Hokkaido University) Japan |
| Y. Shimogaki (The University of Tokyo) Japan |
| M. Shiratani (Kyushu University) Japan |
| E. Stamate (Technical University of Denmark) Denmark |
| K. Takahashi (Kyoto Institute of Technology) Japan |
| Chair: |
M. Fukasawa (Sony Semiconductor Solution Corp.) Japan |
| Vice-chair: |
M. Terahara (SanDisk Ltd.) Japan |
| Vice-chair: |
M. Matsui (Hitachi, Ltd.) Japan Japan |
| J-P. Booth (CNRS/Ecole Polytechnique) France |
| R. Dussart (CNRS/Université d'Orléans) France |
| A. Dzarasova (Quantemol Ltd.) UK |
| D.J. Economou (University of Houston) USA |
| E. Eriguchi (Kyoto University) Japan |
| N. Hayashi (Kyushu University) Japan |
| T. Hayashi (Nagoya University) Japan |
| S. Higashi (Hiroshima University) Japan |
| M. Hiramatsu (Meijo University) Japan |
| M. Honda (TOKYO ELECTRON MIYAGI LTD.) Japan |
| T. Ichiki (The University of Tokyo) Japan |
| K. Ishikawa (Nagoya University) Japan |
| Y. Ishii (Hitachi High Technologies America, Inc.) USA |
| S. Y. Kang (Tokyo Electron Ltd.) Japan |
| S. Kanakasabapathy (Lam Research Corp.) USA |
| K. Karahashi (Osaka University) Japan |
| H. Kobayashi (Hitachi, Ltd.) Japan |
| K. Koga (Kyushu University) Japan |
| H. Kokura (Samsung Electronics Co., Ltd.) Korea |
| H. Kondo (Nagoya University) Japan |
| A. Koshiishi (Samsung Electronics Co., Ltd. ) Korea |
| T. Koshizawa (Applied Materials Inc.) Japan |
| N. Kuboi (Sony Semiconductor Solutions Corp.) Japan |
| K. Kurihara (Toshiba Memory Corp.) Belgium |
| M. Kurihara(Hitachi, Ltd.) Japan |
| H. Kuwano (Tohoku University) Japan |
| J-F. de Marneffe (Interuniversity Microelectronics Center-IMEC) Belgium |
| T. Maruyama (Renesas Electronics Corp.) Japan |
| S. Miyazaki (Nagoya University) Japan |
| H. Miyazoe (IBM Corp.) USA |
| M. Morimoto (Hitachi High-Technologies Corp. Taiwan) Taiwan |
| K. Nakamura (Chubu University) Japan |
| M. Nakamura (MAMO) Japan |
| Y. Nakamura (Sony Semiconductor Manufacturing Corp.) Japan |
| M. Nakatani (Panasonic Corp.) Japan |
| S. Nunomura (Advanced Industrial Science and Technology -AIST) Japan |
| T. Ohba (Lam Research Corp.) Japan |
| M. Ohuchi (Micron Memory Japan, Inc.) Japan |
| H. Ohtake (Tokyo Electron Ltd.) USA |
| T. Okumura (Panasonic Corp.) Japan |
| M. Omura (Toshiba Memory Corp.) Japan |
| J. Park (Samsung Electronics Co., Ltd.) Korea |
| F. Roozeboom (Eindhoven University of Technology-TU/e) Netherlands |
| Y. Sakiyama (Lam Research Corp.) USA |
| K. Sasaki (Hokkaido University) Japan |
| M. Sekine (Nagoya University) Japan |
| Y. Setsuhara (Osaka University) Japan |
| Y. Shimogaki (The University of Tokyo) Japan |
| T. Shirafuji (Osaka City University) Japan |
| M. Shiratani (Kyushu University) Japan |
| E. Stamate (Technical University of Denmark) Denmark |
| K. Takahashi (Kyoto Institute of Technology) Japan |
| M. Titus (Western Digital Corp. SanDisk) USA |
| H. Toyoda (Nagoya University) Japan |
| J. H. A. Um (Samsung Electronics Co., Ltd.) Korea |
| T. Watanabe (Waseda University) Japan |
| T. Yagisawa (Toshiba Memory Corp.) Japan |
| H. Yamauchi (Sharp Corp.) Japan |
| G-Y. Yeom (Sungkyunkwan University) Korea |
| T-Y Yu (TSMC) Taiwan |
| Chair: |
K. Ishikawa (Nagoya University) Japan |
| T. Iwase (Hitachi, Ltd.) Japan |
| Y. Kamaji (Hitachi High-Technologies Corp.) Japan |
| S. Y. Kang (Tokyo Electron Ltd.) Japan |
| K. Koga (Kyushu University) Japan |
| N. Kuboi (Sony Semiconductor Solutions Corp.) Japan |
| H. Nagai (Panasonic Corp.) Japan |
| M. Nakamura (MAMO) Japan |
| N. Negishi (Hitachi, Ltd.) Japan |
| T. Nozaki (Tokyo Institute of Technology) Japan |
| S. Nunomura (Advanced Industrial Science and Technology -AIST) Japan |
| D. Ogawa (Chubu University) Japan |
| M. Omura (Toshiba Memory Corp.) Japan |
| K. Shinoda (Hitachi, Ltd.) Japan |
| Y. Sonoda (Hitachi High-Technologies Corp.) Japan |
| H. Suzuki (Nagoya University) Japan |
| K. Takahashi (Kyoto Institute of Technology) Japan |
| T. Tsutsumi (Nagoya University) Japan |
| M. Yamamoto (Panasonic Corp.) Japan |
| K. Yoshikawa (Toshiba Memory Corp.) Japan |