Chair: |
K. Kinoshita (AIO Core Co., Ltd.) Japan |
Vice-chair: |
H. Hayashi (Toshiba Memory Corp.) Japan |
H. Akatsuka (Tokyo Institute of Technology) Japan |
N. Fujiwara (Mitsubishi Electric Corp.) Japan |
M. Fukasawa (Sony Semiconductor Solutions Corp.) Japan |
S. Hamaguchi (Osaka University) Japan |
S. Higashi (Hiroshima University) Japan |
M. Honda (TOKYO ELECTRON MIYAGI LTD.) Japan |
M. Hori (Nagoya University) Japan |
T. Ichiki (The University of Tokyo) Japan |
T. Ishijima (Kanazawa University) Japan |
K. Ishikawa (Nagoya University) Japan |
K. Karahashi (Osaka University) Japan |
H. Kokura (Samsung Electronics Co., Ltd) Korea |
T. Koshizawa (Applied Materials Inc.) USA |
M. Matsui (Hitachi, Ltd.) Japan |
N. Negishi (Hitachi, Ltd.) Japan |
K. Nojiri (Lam Research Corp.) Japan |
T. Ohiwa (TOKYO ELECTRON LIMITED) Japan |
T. Okumura (Panasonic Corp.) Japan |
K. Sasaki (Hokkaido University) Japan |
M. Sekine (Nagoya University) Japan |
T. Shirafuji (Osaka City University) Japan |
T. Tatsumi (Sony Semiconductor Solutions Corp.) Japan |
M. Terahara (SanDisk Ltd.) Japan |
Chair: |
M. Hori (Nagoya University) Japan |
Vice-chair: |
S. Higashi (Hiroshima University) Japan |
Vice-chair: |
H. Akatsuka (Tokyo Institute of Technology) Japan |
C. Abe (Toshiba Memory Corp.) Japan |
J. Hashimoto (Toshiba Memory Corp.) Japan |
T. Imamura (Toshiba Memory Corp.) Japan |
H. Kondo (Nagoya University) Japan |
K. Makihara (Nagoya University) Japan |
Y. Miyoshi (Sony Semiconductor Solutions Corp.) Japan |
S. Ochiai (Toshiba Memory Corp.) Japan |
D. Ogawa (Chubu University) Japan |
Y. Sato (AGC Asahi Glass) Japan |
K. Shinoda (Hitachi, Ltd.) Japan |
H. Suzuki (Nagoya University) Japan |
K. Takeda (Meijo University) Japan |
W. Takeuchi (Aichi Institute of Technology) Japan |
A. Tanide (Nagoya University) Japan |
M. Terahara (SanDisk Ltd.) Japan |
T. Tsutsumi (Nagoya University) Japan |
R.H.J. Vervuurt (ASM Japan) Japan |
Chair: |
T. Ishijima (Kanazawa University) Japan |
Vice-chair: |
T. Shirafuji (Osaka City University) Japan |
Vice-chair: |
K. Karahashi (Osaka University) Japan |
K. Ishikawa (Nagoya University) Japan |
T. Ichiki (The University of Tokyo) Japan |
K. Eriguchi (Kyoto University) Japan |
S. Higashi (Hiroshima University) Japan |
K. Kinoshita (AIO Core Co., Ltd.) Japan |
N. Kuboi (Sony Semiconductor Solutions Corp.) Japan |
H. Kuwano (Tohoku University) Japan |
S. Nunomura (Advanced Industrial Science and Technology-AIST) Japan |
L. Overzet (University of Texas at Dallas) USA |
K. Sasaki (Hokkaido University) Japan |
Y. Shimogaki (The University of Tokyo) Japan |
M. Shiratani (Kyushu University) Japan |
E. Stamate (Technical University of Denmark) Denmark |
K. Takahashi (Kyoto Institute of Technology) Japan |
Chair: |
M. Fukasawa (Sony Semiconductor Solution Corp.) Japan |
Vice-chair: |
M. Terahara (SanDisk Ltd.) Japan |
Vice-chair: |
M. Matsui (Hitachi, Ltd.) Japan Japan |
J-P. Booth (CNRS/Ecole Polytechnique) France |
R. Dussart (CNRS/Université d'Orléans) France |
A. Dzarasova (Quantemol Ltd.) UK |
D.J. Economou (University of Houston) USA |
E. Eriguchi (Kyoto University) Japan |
N. Hayashi (Kyushu University) Japan |
T. Hayashi (Nagoya University) Japan |
S. Higashi (Hiroshima University) Japan |
M. Hiramatsu (Meijo University) Japan |
M. Honda (TOKYO ELECTRON MIYAGI LTD.) Japan |
T. Ichiki (The University of Tokyo) Japan |
K. Ishikawa (Nagoya University) Japan |
Y. Ishii (Hitachi High Technologies America, Inc.) USA |
S. Y. Kang (Tokyo Electron Ltd.) Japan |
S. Kanakasabapathy (Lam Research Corp.) USA |
K. Karahashi (Osaka University) Japan |
H. Kobayashi (Hitachi, Ltd.) Japan |
K. Koga (Kyushu University) Japan |
H. Kokura (Samsung Electronics Co., Ltd.) Korea |
H. Kondo (Nagoya University) Japan |
A. Koshiishi (Samsung Electronics Co., Ltd. ) Korea |
T. Koshizawa (Applied Materials Inc.) Japan |
N. Kuboi (Sony Semiconductor Solutions Corp.) Japan |
K. Kurihara (Toshiba Memory Corp.) Belgium |
M. Kurihara(Hitachi, Ltd.) Japan |
H. Kuwano (Tohoku University) Japan |
J-F. de Marneffe (Interuniversity Microelectronics Center-IMEC) Belgium |
T. Maruyama (Renesas Electronics Corp.) Japan |
S. Miyazaki (Nagoya University) Japan |
H. Miyazoe (IBM Corp.) USA |
M. Morimoto (Hitachi High-Technologies Corp. Taiwan) Taiwan |
K. Nakamura (Chubu University) Japan |
M. Nakamura (MAMO) Japan |
Y. Nakamura (Sony Semiconductor Manufacturing Corp.) Japan |
M. Nakatani (Panasonic Corp.) Japan |
S. Nunomura (Advanced Industrial Science and Technology -AIST) Japan |
T. Ohba (Lam Research Corp.) Japan |
M. Ohuchi (Micron Memory Japan, Inc.) Japan |
H. Ohtake (Tokyo Electron Ltd.) USA |
T. Okumura (Panasonic Corp.) Japan |
M. Omura (Toshiba Memory Corp.) Japan |
J. Park (Samsung Electronics Co., Ltd.) Korea |
F. Roozeboom (Eindhoven University of Technology-TU/e) Netherlands |
Y. Sakiyama (Lam Research Corp.) USA |
K. Sasaki (Hokkaido University) Japan |
M. Sekine (Nagoya University) Japan |
Y. Setsuhara (Osaka University) Japan |
Y. Shimogaki (The University of Tokyo) Japan |
T. Shirafuji (Osaka City University) Japan |
M. Shiratani (Kyushu University) Japan |
E. Stamate (Technical University of Denmark) Denmark |
K. Takahashi (Kyoto Institute of Technology) Japan |
M. Titus (Western Digital Corp. SanDisk) USA |
H. Toyoda (Nagoya University) Japan |
J. H. A. Um (Samsung Electronics Co., Ltd.) Korea |
T. Watanabe (Waseda University) Japan |
T. Yagisawa (Toshiba Memory Corp.) Japan |
H. Yamauchi (Sharp Corp.) Japan |
G-Y. Yeom (Sungkyunkwan University) Korea |
T-Y Yu (TSMC) Taiwan |
Chair: |
K. Ishikawa (Nagoya University) Japan |
T. Iwase (Hitachi, Ltd.) Japan |
Y. Kamaji (Hitachi High-Technologies Corp.) Japan |
S. Y. Kang (Tokyo Electron Ltd.) Japan |
K. Koga (Kyushu University) Japan |
N. Kuboi (Sony Semiconductor Solutions Corp.) Japan |
H. Nagai (Panasonic Corp.) Japan |
M. Nakamura (MAMO) Japan |
N. Negishi (Hitachi, Ltd.) Japan |
T. Nozaki (Tokyo Institute of Technology) Japan |
S. Nunomura (Advanced Industrial Science and Technology -AIST) Japan |
D. Ogawa (Chubu University) Japan |
M. Omura (Toshiba Memory Corp.) Japan |
K. Shinoda (Hitachi, Ltd.) Japan |
Y. Sonoda (Hitachi High-Technologies Corp.) Japan |
H. Suzuki (Nagoya University) Japan |
K. Takahashi (Kyoto Institute of Technology) Japan |
T. Tsutsumi (Nagoya University) Japan |
M. Yamamoto (Panasonic Corp.) Japan |
K. Yoshikawa (Toshiba Memory Corp.) Japan |